OS GSO IEC 60444-6:2014
IEC 60444-6:2013
Omani Standard
Current Edition
·
Approved on
25 December 2014
Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
OS GSO IEC 60444-6:2014 Files
English
38 Pages
Current Edition
Reference Language
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OS GSO IEC 60444-6:2014 Scope
This part of IEC 60444 applies to the measurements of drive level dependence (DLD) of quartz crystal units. Two test methods (A and C) and one referential method (B) are described. “Method A”, based on the π-network according to IEC 60444-1, can be used in the complete frequency range covered by this part of IEC 60444. “Reference Method B”, based on the π- network or reflection method according to IEC 60444-1, IEC 60444-5 or IEC 60444-8 can be used in the complete frequency range covered by this part of IEC 60444. “Method C”, an oscillator method, is suitable for measurements of fundamental mode crystal units in larger quantities with fixed conditions.
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